Advanced Transmission Electron Microscopy: Imaging and by Jian Min Zuo, John C.H. Spence PDF

By Jian Min Zuo, John C.H. Spence

ISBN-10: 1493966057

ISBN-13: 9781493966059

ISBN-10: 1493966073

ISBN-13: 9781493966073

This quantity expands and updates the insurance within the authors' well known 1992 booklet, Electron Microdiffraction. because the name implies, the focal point of the ebook has replaced from electron microdiffraction and convergent beam electron diffraction to all varieties of complex transmission electron microscopy. detailed cognizance is given to electron diffraction and imaging, together with high-resolution TEM and STEM imaging, and the applying of those the way to crystals, their defects, and nanostructures. The authoritative textual content summarizes and develops lots of the beneficial wisdom which has been received through the years from the examine of the a number of electron scattering challenge, the new improvement of aberration correctors and their purposes to fabrics constitution characterization, in addition to the authors' wide educating event in those components. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is perfect to be used as a complicated undergraduate or graduate point textual content in aid in fact fabrics in fabrics technology, Physics or Chemistry departments.

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Additional info for Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience

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Considering that electrons are typically emitted from areas about the size of an atom, and the source dimension is much larger than an atom, most electron sources can be considered to be ideally incoherent, that is, to consist of a statistically independent close-packed array of emitters. For such an incoherent extended source, each atomic point-source point generates an independent interference pattern at the detector. What is recorded then is the sum of the intensities of the interference patterns generated by each independent source point.

Theoretical work on the dynamical theory with emphasis on the symmetry properties of the scattering was continued throughout the 1950s by researchers such as Niehrs, Fukahara, Fues, Howie and Whelan, Fujimoto, Miyake, Tournarie, Sturkey, and Cowley and Moodie. In 1957, K. Kambe, in his study of three-beam theory, showed that the intensity depends on a certain sum of three structure-factor phases (the three-phase invariant), which is independent of the choice of origin and so might be measured. Throughout the sixties, the CBED method was developed almost solely by Lehmpfuhl in Berlin, and by Goodman and Moodie in Melbourne using the unsatisfactory (but modifiable) instruments available to them.

34 2 Electron Waves and Wave Propagation For 0\s\so , we have the following two scenarios & dðtÞ À dðt þ sÞ ¼ 0; 0\t\so À s Dn À Dn þ 1 ; so À s\t\so This applies to every coherent period in the quasi-monochromatic wave. By summing up all coherent periods, we obtain the integral of Eq. 1 Nso : ; n¼0 0 ¼ expðÀixsÞ  ¼ 1À 1 so so Às so Às Z dt 0  s expðÀixsÞ so ð2:40Þ for 0\s\so . Here, the second sum over the random phases averages to zero. Together, the above results show that the visibility of interference fringes jc12 ðsÞj decreases linearly with the delay time and disappears beyond the coherence time.

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Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience by Jian Min Zuo, John C.H. Spence


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